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Pascal Getreuer, “Contour stencils for edge-adaptive image interpolation.” Proceedings of SPIE, vol. 7257, 2009. DOI: 10.1117/12.806014.

Article permalink: http://dx.doi.org/10.1117/12.806014

    title = {Contour Stencils for Edge-Adaptive Image Interpolation},
    author = {Pascal Getreuer},
    booktitle = {Proceedings of {SPIE}},
    volume = {7257},
    year = {2009},
    doi = {10.1117/12.806014}

See also the follow-up work “Contour Stencils: Total Variation along Curves for Adaptive Image Interpolation.”.


We first develop a simple method for detecting the local orientation of image contours and then use this detection to design an edge-adaptive image interpolation strategy. The detection is based on total variation: small total variation along a candidate curve implies that the image is approximately constant along that curve, which suggests it is a good approximation to the contours. The proposed strategy is to measure the total variation over a “contour stencil,” a set of parallel curves localized over a small patch in the image. This contour stencil detection is used to design an edge-adaptive image interpolation strategy. The interpolation is computationally efficient, operates robustly over a variety of image features, and performs competitively in a comparison against existing methods. The method extends readily to vector-valued data and is demonstrated for color image interpolation. Other applications of contour stencils are also discussed.

©2009 Society of Photo-Optical Instrumentation Engineers. This paper was published in the Journal of Electronic Imaging and is made available as an electronic reprint with permission of SPIE. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.